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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-304
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C09K3-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B24B37-00
filingDate 1999-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9781550fa9363d563c3b138e0f76302a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a502aadc0cb984c9018ac0fb16897108
publicationDate 2001-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001077061-A
titleOfInvention Abrasive for semiconductor
abstract An object of the present invention is to provide an excellent abrasive which can flatten a metal layer and / or a barrier layer in a semiconductor device manufacturing process. SOLUTION: The weight average particle diameter is 0.1 to 0.3 μm. m, cerium oxide particles having an average crystallite diameter of 150 to 600 ° are used as abrasive grains.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6786945-B2
priorityDate 1999-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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