| abstract |
(57) [Problem] To provide a test socket for an electronic device or a semiconductor package capable of stably and continuously making good electrical contact between a contact terminal and an external connection terminal. SOLUTION: An end portion to be contacted with an external connection terminal of a contact terminal of a test socket of an electronic device or a semiconductor package is divided into a plurality of end portions, and the plurality of end portions are respectively connected to different elastic portions. Directly or via the other elastic part connected to a common support part, so that even if a plurality of tip parts move horizontally, the tip parts collide with each other, Horizontal movement was suppressed, and relative sliding between the tip and the external connection terminal was suppressed. |