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filingDate 1999-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d3ec42201e7b344b66b3dc2c2a0be466
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4ae12491b7b52a890757cb7771ed702
publicationDate 2000-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000357347-A
titleOfInvention Recording medium manufacturing system and recording medium manufacturing method
abstract (57) [Summary] Even when a plurality of manufacturing apparatuses are used in parallel in one process, it is possible to easily and reliably grasp the yield of each of the plurality of manufacturing apparatuses and the yield of each process. . A first inspection screen includes a production data display unit and a defect detail display unit. The production data display section 520 is divided into the total number and the latest 100, and the number of non-defective products, the number of defective products, and the yield with respect to the total number of the optical discs D are displayed separately for each molding machine. The number of products and the yield are displayed separately for each molding machine. The defect breakdown display section 522 displays the first And the number of various defects and the yield of each substrate 202 formed by the second forming equipments 12A and 12B are 6 Each spin coater is displayed separately. The defect breakdown display section 522 is also divided into the total number and the latest 100.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006351103-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4559306-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8130627-B2
priorityDate 1999-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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