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filingDate 2000-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21747acfb77b0d181ab4dff0d66658d4
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publicationDate 2000-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000286426-A
titleOfInvention Semiconductor device and manufacturing method thereof
abstract (57) [Problem] In a hydrogenation method using plasma, as a result of directly exposing a crystalline semiconductor film to plasma, ions generated simultaneously in the plasma damage the crystalline semiconductor film. There was a problem. When the substrate is heated to 400 ° C. or higher to recover this damage, hydrogen has been disadvantageously released from the crystalline semiconductor film. SOLUTION: On a semiconductor layer formed in a predetermined shape, A step of forming a first insulating film containing hydrogen, a step of performing heat treatment in an atmosphere containing hydrogen or hydrogen generated by being converted to plasma, and a step of forming a first insulating film containing hydrogen in close contact with the first insulating film. A step of forming a second insulating film, and a step of performing a heat treatment in an atmosphere containing hydrogen or hydrogen generated by being converted into plasma, and further including hydrogen on the second insulating film. After forming the third insulating film, a step of performing heat treatment in an atmosphere containing hydrogen or nitrogen is performed.
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