http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000275193-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N9-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20 |
| filingDate | 1999-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b0ea5c6d580e9c8e35384896b476066 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_765111779784541c16b06ef794bda89c |
| publicationDate | 2000-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2000275193-A |
| titleOfInvention | Method and apparatus for measuring surface density |
| abstract | (57) [Summary] [PROBLEMS] To non-destructively measure a surface density in a minute region. SOLUTION: A sample 3 is held on a goniometer 14 having a sample rotating mechanism. From the primary X-ray 4 is set. The intensity of the diffracted / scattered X-ray 5 diffracted and scattered by the sample 3 is measured by an X-ray detector 6. The calculating unit 13 calculates the diffraction angle 2 from the intensity distribution of the diffracted / scattered X-rays 5 measured by the X-ray detector 6. At the same time as detecting θ, the emission angle β is defined. From the data of the incident angle α and the diffraction angle 2θ, or the data of the emission angle β and the diffraction angle 2θ, the amount of change in the diffraction angle due to the refraction effect of X-rays is obtained, and the density of the material constituting the surface of the sample 3 is determined based on that. calculate. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105403482-A |
| priorityDate | 1999-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 21.