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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-108
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8242
filingDate 1999-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ff5d6127c116c5a6e1c9d9539d9e6fb1
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publicationDate 2000-09-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000243929-A
titleOfInvention Semiconductor device and manufacturing method thereof
abstract (57) Abstract: An electric field in a semiconductor region of a memory cell selection transistor is reduced. SOLUTION: A groove 15 is formed in a semiconductor substrate 1 below a connection hole 14A to which a capacitor is connected, and an insulating film 16 is formed on a side surface of the groove 15. By forming the n + -type semiconductor region 9b of ETQs at a deep position in the semiconductor substrate 1, the gate electrode 7A and the n + -type semiconductor region 9b are separated from each other without increasing the area occupied by the element. .
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100726146-B1
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type http://data.epo.org/linked-data/def/patent/Publication

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