http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000214205-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0950e9df7f0e1b73efee1bda859951ad |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1999-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1b230f5431075b478a2304da5f1486e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34548dfaf3242897cbd2a2f4e46d35c2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b1744f311b20146a883eb4849f5c447 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f7d2ca930eb2f592a170391539ec9c1 |
| publicationDate | 2000-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2000214205-A |
| titleOfInvention | Semiconductor deterioration detection method, semiconductor remaining life calculation method, and element and substrate used therein |
| abstract | (57) Abstract: A semiconductor deterioration detection method and a semiconductor remaining life calculation method capable of detecting the degree of deterioration of an internal semiconductor element and calculating the remaining life without hindering the function of an electronic device, and used in these. Provide a deterioration detection element and the like. An electronic device is provided with a semiconductor deterioration detection element having a plurality of internal wirings (3) connected between lead frames (4) of a semiconductor package (1) with a wiring material in order to measure a degree of deterioration in advance. By applying a current to the plurality of internal wirings 3 by gradually changing the applied voltage from the power supply 2 used in the electronic device and detecting the amount of corrosion of the internal wirings 3, The degree of deterioration of a semiconductor element mounted on an electronic device is detected. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020178882-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7098045-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2020178882-A1 |
| priorityDate | 1999-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 |
Total number of triples: 20.