http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000209093-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0950e9df7f0e1b73efee1bda859951ad |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-46 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-0607 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-46 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-06 |
| filingDate | 1999-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ee3d874df5f973ecaca3af7cf23ee8ac |
| publicationDate | 2000-07-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2000209093-A |
| titleOfInvention | Successive approximation analog-to-digital converter |
| abstract | (57) Abstract: There is provided a successive approximation type analog / digital conversion circuit for correcting an error generated in an A / D conversion code by a parasitic resistance of a D / A conversion circuit on a semiconductor chip. A switching switch for performing a switching operation between a sample / hold period and a comparator period between a D / A conversion circuit and a voltage comparison circuit, and first and second level shift circuits each including a plurality of capacitors. The first level shift circuit supplies the plurality of capacitors with an offset correction voltage for correcting a voltage drop caused by a parasitic resistance of the D / A conversion circuit, and the D / A conversion code The second level shift circuit corrects the error generated in the A / A conversion voltage, and corrects the error generated for each bit of the D / A conversion code in the successive approximation process, using the first and second level shift circuits. By combining the offset correction and the offset / full scale correction, an error generated in the A / D conversion code can be corrected on the semiconductor chip. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100536543-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017079418-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008544649-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7924206-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114895175-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7595747-B2 |
| priorityDate | 1999-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7156993 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID426135032 |
Total number of triples: 22.