http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000146855-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_03d0f52bb4069f8a19d70dcfb697c67a |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B20-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-95 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B7-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-94 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 |
| filingDate | 1998-11-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4ae12491b7b52a890757cb7771ed702 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7434fee50ac8395d32d0b4fff3e77b31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d3ec42201e7b344b66b3dc2c2a0be466 |
| publicationDate | 2000-05-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2000146855-A |
| titleOfInvention | Optical information recording medium defect inspection apparatus and method, and defect size determination method |
| abstract | (57) [Summary] In a manufacturing stage of an optical information recording medium, a defect which is likely to grow due to a state of subsequent storage is detected, and the optical information recording medium having such a defect is eliminated in advance. A first method for detecting the presence or absence of a Halley defect by comparing a detection level Vi with a threshold value Va for detecting a Halley defect. The comparator 502 compares the detection level Vi with a threshold value Vb for detecting foreign matter to detect the presence or absence of foreign matter. The size of the Halley defect is determined based on the comparator 504, the detection level Vi and the first size detection level Vc, and when the obtained size indicates 200 μm or more, The size of a foreign substance is determined based on the first determination circuit 520 for determining the substrate as defective and the detection level Vi and the second size detection level Vd. If the obtained size indicates 50 μm or more, the substrate is determined. And a second determination circuit 526 for determining a failure. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20220109625-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103245667-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102528968-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105891215-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105891215-B |
| priorityDate | 1998-11-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 40.