http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000088915-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2862
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2875
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1998-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c3a3bdffe4e2992d6d50ff2499bec066
publicationDate 2000-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000088915-A
titleOfInvention Semiconductor test method and apparatus
abstract (57) [Problem] To provide a semiconductor test method and apparatus capable of performing a test by applying substantially constant temperature stress to all semiconductor devices. A heating element provided with a ferromagnetic material having a magnetic transformation point substantially equal to a set temperature is provided above a semiconductor device, and the ferromagnetic material is electromagnetically generated by an alternating magnetic field generated by a magnetic coil. Induction heating semiconductor device 10 Heat. When the temperature approaches the set temperature, the ferromagnetic material 31 corresponding to the semiconductor device 10 generating a large amount of self-heating quickly reaches the magnetic transformation point, and thereby the heat generated by the magnetic hysteresis loss of the ferromagnetic material 31 disappears. Thereafter, the temperature difference between the semiconductor device 10 and the other semiconductor device 10 becomes smaller, Finally, the temperatures of all the semiconductor devices 10 become substantially constant at the set temperature.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2005017543-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7619427-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008193079-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8063653-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010107443-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4768710-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8878527-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003218391-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8653843-B2
priorityDate 1998-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 25.