http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2566115-A

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filingDate 2017-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2019-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber GB-2566115-A
titleOfInvention Imaging of a sample through a scattering medium
abstract A sample 4 is imaged through a scattering medium 6 by illuminating the sample through the scattering medium with spatially patterned electromagnetic radiation and for each pattern 11 measuring the emitted electromagnetic radiation generated by the sample as a result of the interaction of the incident radiation with the sample. The patterned radiation may be a set of mutually complementary patterns, a set of pairs of inverse spatial radiation patterns, a full orthonormal basis set, a set of Hadamard patterns or a plurality of binary spatial radiation patterns. The spatial patterns of incident electromagnetic radiation may be Hermite-Gaussian modes, Laguerre-Gaussian modes, Bessel modes, eigenmodes such as optical eigenmodes or a plurality of greyscale spatial radiation patterns. The spatial patterns of incident radiation may be a number N of phase-shifting sinusoidal radiation patterns for each spatial frequency where each pattern has a phase shift of 2π/N relative to an adjacent pattern. This may allow imaging beyond the diffraction limit. The emitted radiation may be measured by a single pixel detector or a multi-pixel detector. The incident electromagnetic radiation may consist of a range of different wavelengths which may be dispersed along different paths and focused to the focal plane or volume.
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