http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2560164-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3d13f2ab3429f40f0dcd1cfc22cc02ed
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_95969fcf2e7029e2da1a8c36da1fdb17
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-207
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20
filingDate 2017-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_751986d137395de68351f4ee3c72886d
publicationDate 2018-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber GB-2560164-A
titleOfInvention Sample inspection apparatus employing a diffraction detector
abstract A sample inspection apparatus comprises a source of radiation such as X-rays 102 , a beam forming collimator such as a mask or a polycapillary optical element for producing a substantially conical shell of radiation 112, a radiation detector 1400 receiving radiation diffracted after incidence of the shell on a sample such as a crystal 110, a coded aperture 1404 provided at a detection surface of the radiation detector, and a range detector 1402 which collects radiation transmitted through the aperture. The aperture may be placed along a symmetry axis of the apparatus, and at the expected location of a hotspot formed by the intersection of Debye cones caused by scattering photons. The device may comprises a coded aperture mask having a plurality of apertures, and a central occluder at one or more aperture to eliminate stray illumination.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2585673-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2585673-B
priorityDate 2017-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 21.