http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2536539-A

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filingDate 2016-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ad8e76a294b237c4a4555e54a11063fb
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publicationDate 2016-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber GB-2536539-A
titleOfInvention System and method for testing multi-user, multi-input/multi-output systems
abstract A test system for testing a multi-input multi-output (MIMO) device under test (DUT) includes: one or more signal processors configured to generate a plurality of independent uplink signals and to apply uplink fading channel characteristics to each of the independent uplink signals to generate a plurality of independent faded uplink test signals; a switch network configured to provide the plurality of independent faded uplink test signals to respective ports for transmission to the MIMO DUT, and further configured to receive via the ports downlink signals from the MIMO DUT; and the one or more signal processors further configured to apply downlink fading channel characteristics to the downlink signals from the MIMO DUT to generate a plurality of downlink faded test signals; and means for determining at least one performance characteristic of the MIMO DUT from the plurality of downlink faded test signals. The test system is particularly suited to testing massive MIMO base stations.
priorityDate 2015-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 24.