| abstract |
In a semiconductor device, at least one programmed dummy cell is located adjacently to an end portion of a reference array part (53). Accordingly, there will occur no current leakage during reading of the data stored in the end portion of the reference array part (53). Besides, any current leakage can be prevented from occurring in the memory cells of the central portion of the reference array part (53) during reading of data from all the reference cells because the adjacent reference cells are programmed. Therefore, the reference current can be supplied in a stable manner. |