| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_406aa9d2aeb99a3312ad567062c68ea3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_526cb931f1382d6e016ee651d55e1365 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-195 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00013
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N17-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00055
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00031
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00063
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-00053
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N25-76 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N1-195 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-335
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N17-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate |
1996-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_02487c3c2a349693c13470c47fda0565 |
| publicationDate |
1997-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
GB-2302954-A |
| titleOfInvention |
Image sensor array test |
| abstract |
The invention provides for an image sensor array test apparatus and method in which a reset FET (54) is driven with a controllable voltage to set the reverse-bias voltage across a photo-diode (58) at any selectable level of test voltage. In this way each pixel sensor circuit in the array may be tested as if it had received a desired amount of illumination. The drive voltage for the reset transistor (54) can be provided over a column output line (52) when no row access enable signal is applied to the array. In this situation the column line source follower circuit (62, 64) is inhibited by the row access FETs (60). Thus, a separate test voltage can be driven onto the column line (52), through a reset switch (68, 69), and connected through the pixel sensor reset transistor (54) to the pixel sensor photo-diode (58). The variable reset voltage, that is driven onto the column line (52), can be varied between ground and the normal bias voltage V DD for the pixel sensor by use of parallel connected P-channel FET (69) and N-channel FET (68). Alternatively the reset FET (54) could be driven directly by a variable voltage supply (Fig. 2 not shown). |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0892552-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0892552-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6118115-A |
| priorityDate |
1995-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |