http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2267786-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7e6f65af193d6cfc3b391b821e752540 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07328 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 1993-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41c8c3599d2ee5b0ec64afef9cf3ff35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9a7db299614354837f702a4a6854103f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f8329df0bbb0e6c7739c27e4ef169f4f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e5b9a48728bf121f4c70a18c845b56e |
| publicationDate | 1993-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | GB-2267786-A |
| titleOfInvention | Test fixture |
| abstract | A test fixture (20) for testing circuit boards has a vacuum chamber between a stationary probe plate (26) and a movable top plate (28). Separate adjustable linear bearings (34, 130) provide parallel alignment between the top plate and the probe plate. A continuous vacuum seal (36) between the probe plate and top plate bypasses the bearings so the bearings are outside the vacuum area. Spring loaded test probes (30) in the probe plate extend through holes (32) in the top plate for access to a circuit board under test. The probes contact the board when the top plate moves down toward the probes under a vacuum. The top plate is secured to the probe plate by separate quick-release latch pins (34, 128) extending through the linear bearings. The moving top plate carries fixed tooling pins (not shown) for mounting the board to the top plate. Movable bearing blocks (50) support the bearings. The top plate is movable for aligning the beard with the test probes. The top plate, latch pins, bearings and bearing blocks are movable as a unit relative to the probe plate. After the top plate is aligned with the probes to compensate for an shift among circuit board lots, the quick-release latches (136) are engaged to retain the alignment. The latches can comprise part of a guide post assembly for guiding vertical travel of the top plate during vacuum cycling of the test fixture. <IMAGE> |
| priorityDate | 1992-06-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.