| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c72d118f5664072de841f9c5c34b9d99 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-092
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-1476
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2201-098
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-0237
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2201-035
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-0306 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01P3-081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-0242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01P11-003
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-245 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-03
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-09 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01P3-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01P11-00 |
| filingDate |
1983-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b5a12fbed1ba21797ced5e8dad780164 |
| publicationDate |
1984-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
GB-2123615-A |
| titleOfInvention |
Microstrip lines |
| abstract |
A method for fabricating a microstrip resonator line permitting merica precise control of line width, edge definition and thickness. On a substrate 10 there is printed a first conductive layer 12 having a precisely controlled width. The first layer has a thickness less than the desired thickness of the resonator line. Further conductive layers 20 are printed over the first layer to build up to the desired thickness of the resonator line based on skin depth requirement at the frequency of operation. Each of the further conductive layers for building the thickness of the line has a width less than that of the first conductive layer so that resonator line width is controlled by the width of the first layer. <IMAGE> |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-2652226-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0771045-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5900308-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0421179-A1 |
| priorityDate |
1982-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |