http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-1484873-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e9ec95f75bc5dcc8f2c6f36fd3ee1ca6
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-038
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G15-05
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-038
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08G59-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08G59-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027
filingDate 1974-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 1977-09-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber GB-1484873-A
titleOfInvention Delineating a pattern in a negative resist composition
abstract 1484873 Electron sensitive processes WESTERN ELECTRIC CO Inc 23 Oct 1974 [23 Oct 1973] 45812/74 Headings G2C and G2X A process for producing negative resists comprises (1) imagewise exposing to electron beams or x-rays a material comprising a support and a layer of an uncured polymer which contains an ethylenically unsaturated main chain with branches of aliphatic groups at least some of which contain cross-linkable epoxy groups connected to the main chain through at least one atom and there being at least one epoxy group per 5 monomer units; the weight average molecular weight (M n ) being 10<SP>3</SP> to 10<SP>6</SP> and the ratio M w :M n is less than 5, M n being the number average molecular weight; the lower temperature limit of the glass transition temperature range (Tg) being below the lowest temperature of the material before exposure, and (2) removing the unexposed and uncross-linked areas with a developer. Specified polymers are poly'glycidyl acrylate, glycidyl methacrylate/ethyl acrylate copolymers and polymers which contain vinyl ferrocene which acts as an x-ray absorber, the polymers preferably having a Tg below 22‹C. Polyglycidylmethacrylate (Tg = 46‹C) is stated to be unevitable. The developed resist may be post baked for 5-30 minutes at 60-130‹C to increase cross-linking. The resist may be stripped off the support by hot (50‹C) chromic acid solution or by an oxygen plasma at 300w., 25 milltorr. pressure.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5496438-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2285141-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2285141-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4485166-A
priorityDate 1973-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7837
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID11986708
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID977
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419527158
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425582611
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24425
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419566604
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523291

Total number of triples: 27.