patent/FR-2978557-A1

Predicate	Object
assignee	http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8292741de96a44319670508be1f78f1a
classificationCPCInventive	http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2644
classificationIPCInventive	http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate	2011-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor	http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1dc26caf0ab68b77ecf3f402fe73dc56 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80e2822b5c3b9eff17103b6a3ccacfad
publicationDate	2013-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber	FR-2978557-A1
titleOfInvention	TEST STRUCTURE OF TRANSISTOR
abstract	The invention relates to a test structure (10) for characterizing the properties of a transistor (TA), comprising a DC test structure (10-1) for testing the DC properties of the transistor, a test structure alternating current (10-2) for testing the ac properties of the transistor, and in which DC and AC test structures have common test ranges (P12, P13, P14).
priorityDate	2011-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type	http://data.epo.org/linked-data/def/patent/Publication

Predicate	Subject
isCitedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0605812-A1
isDiscussedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520982 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID188318

Total number of triples: 16.