| abstract |
The invention relates to a method for calibrating an X-ray material identification device, comprising: a) the determination of at least one calibration material and, for each calibration material, at least one thickness of calibration of this material, b) the measurement, for each calibration material and for the chosen thicknesses, of attenuation or transmission coefficients of X-radiation, c) the calculation of statistical parameters from said coefficients, d) the determining, for each calibration material and each calibration thickness, a presence probability distribution law, as a function of said statistical parameters. |