| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6ced56edb201eee3db8fd142022bcb7d |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31717
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318385 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3193
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-317 |
| filingDate |
2010-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5607ee4cd9e897c9cf63b73dce63783d |
| publicationDate |
2011-12-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
FR-2960978-A1 |
| titleOfInvention |
ASYNCHRONOUS SEQUENCE COMPARATOR FOR INTEGRATED SELF-TEST CIRCUIT |
| abstract |
A method of testing a data connection (105) using at least one test sequence, the method comprising the steps of: providing a first bit sequence by a first generator; duplicate the first sequence to generate a second bit sequence identical to the first; and generating said at least one test sequence based on the first and second sequences. |
| priorityDate |
2010-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |