Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2493e3faf1802fb3cf19f36649b570f3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_37f4922dfb7777b019e504b885211b8e |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-1006 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-03 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-4866 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-10 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-03 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-12 |
filingDate |
2004-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ada0a7cfa9187cf3867227c84ee2e084 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ea11e667f3daed6e791dfe28662bf681 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d5c8351a1f5b4d88eac9aaa7c4227f20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5f520fba1c9fdde2965a334662322257 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5cc705598f06cd3b63e944dbe809a0d7 |
publicationDate |
2005-07-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
FR-2865276-A1 |
titleOfInvention |
METHOD AND DEVICE FOR MEASURING DIFFERENTIAL MICROCALORIMETRIC ANALYSIS OF A MATERIAL LIKELY TO CONTAIN CRYSTALS |
abstract |
The invention relates to a device (30) for measuring a differential microcalorimetric analysis of a material likely to contain crystals with respect to a reference material, comprising: - a temperature-controlled zone (25), - a sampling means and displacement (4) of a sample taken (13), - two measuring means (14, 15) of the temperature of said sample (13) and of the temperature of a reference sample (12) in said zone to The invention also relates to a method for monitoring the amount of crystals present in a material, and its use for tempering chocolate. Figure 2 to publish. |
priorityDate |
2004-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |