http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-2836992-A1

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-0616
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B15-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06
filingDate 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d098c1b3ffad19994e2c02e235b2d74
publicationDate 2003-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber FR-2836992-A1
titleOfInvention PROCESS AND INSTALLATION FOR CONTINUOUS MEASUREMENT OF THE THICKNESS OF A THIN FILM DEPOSITED ON A TAPE WITH A SCROLLING UV PHOTOEMISSIVE SURFACE
abstract The subject of the invention is a method for continuously measuring the thickness of a thin film deposited on a strip with a UV photoemissive surface during travel, according to which: a measuring head with electronic emission by UV excitation is placed ( 10) above the strip (2), said measuring head (10) being separated from the strip (2) by a gas layer, - a flow of the gas layer is created and the measuring head (10) is maintained ) and the strip (2) at a constant distance, - the strip (2) is illuminated by UV light with a wavelength suitable for said surface to emit electrons, - the electrons emitted by the surface are captured, - the intensity of the emission of the electrons captured is measured, and - the thickness of the film (1) is determined by comparing the measured intensity with the intensity of previously calibrated samples. The subject of the invention is also an installation suitable for implementing the method described.
priorityDate 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.