| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_887e125008cf84c53554d9e68cf7f02b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N17-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-902
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-9046
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B7-28 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N17-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B7-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-90 |
| filingDate |
2002-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_31cbf063f2b5da0f7af85cbedbe869e3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_294062c54da22b09838112b9f8e89f54 |
| publicationDate |
2002-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
FR-2825800-A1 |
| titleOfInvention |
METHOD AND SYSTEM FOR DETERMINING AND QUANTIFYING CORROSION DEFECTS ON AND IN METAL COMPONENTS |
| abstract |
The present invention provides a method for detecting a defect or a material defect in a sub-surface within a metallic substrate comprising the steps of: inducing higher frequency and lower frequency eddy current fields in a test substrate; measuring at the surface of the substrate the amplitude of the eddy currents produced in the substrate; andsubtracting the field of higher frequency eddy currents from the field of lower frequency eddy currents, so as to at least allow detection of a fault. |
| priorityDate |
2001-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |