| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-041
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2637
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2831 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-04 |
| filingDate |
1964-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1965-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
1965-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
FR-1415894-A |
| titleOfInvention |
Method for measuring the resistivity of a silicon crystal |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-2558587-A1 |
| priorityDate |
1963-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |