http://rdf.ncbi.nlm.nih.gov/pubchem/patent/ES-2709943-T3
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dcee086ed3f150438e627cd7f4748416 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q1-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-49 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-3274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q1-54 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-4163 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-327 |
| filingDate | 2009-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3aede3182879b2366a43f66a7789ea6e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_818c3077f374dba34707fd8bbf7639b6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b964365ebbe1d3780eca1abea25b171 |
| publicationDate | 2019-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | ES-2709943-T3 |
| titleOfInvention | Method to identify a defect in a test strip |
| abstract | A method of identifying a defect in a test strip comprising: introducing a sample into an electrochemical cell in the form of a test strip that includes a first electrode and a second electrode; applying a first test voltage V1 for a first test time interval T1 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the second electrode; Measure a first test stream i1, a second test stream i2, a third test stream i3, and a fourth test stream i4 that occur during the first test time interval T1, where i1 and i2 can be both Larger current values during the first test time interval T1 and i4 may be the smallest current value that occurs during the first test time interval T1; calculating a first logarithm of a first relationship based on the first test stream i1 and the second test stream i2; and calculating a second logarithm of a second relationship based on the third test stream i3 and the fourth test stream i4; determine if the test strip has a defect using an equation where the equation comprises a third relationship between the first and second logarithms; and providing an error message indicating a defective test strip if the third ratio is less than a predetermined threshold, where the defect is a fluid leak between a spacer and the first electrode. |
| priorityDate | 2008-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 50.