http://rdf.ncbi.nlm.nih.gov/pubchem/patent/ES-2658165-T3

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C07C41-03
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01J27-053
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B01J27-053
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C07B61-00
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C07C41-03
filingDate 2010-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2586ed5d436b98cc83e46768aaa1f484
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publicationDate 2018-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber ES-2658165-T3
titleOfInvention Procedure to produce an ether compound
abstract Process for producing an ether compound, comprising the step of reacting a compound containing a hydroxyl group with an epoxy compound in the presence of a metal oxide from group 4 of the periodic table on which a sulfate ion is supported, in wherein the hydroxyl group-containing compound is represented by the following general formula (1): R1-(OA1)n-(OA2)m-OH (1) wherein R1 is a hydrocarbon group having 1 to 36 atoms carbon; A1 is an alkanediyl group having 2 to 4 carbon atoms; A2 is a hydroxyl group-containing alkanediyl group having 2 to 4 carbon atoms; and n and m represent average degrees of polymerization of the OA1 group and the OA2 group, respectively, where n is a number from 0 to 20 and m is a number from 0 to 2, the epoxy compound is an α-epihalohydrin and/or a compound 1 ,2-epoxy represented by the following general formula (2): **Formula** in which R2 is a hydrocarbon group having 1 to 36 carbon atoms; A3 is an alkanediyl group having 2 to 4 carbon atoms; p is a number from 0 to 20; and q is a number 0 or 1, and the metal of group 4 of the periodic table is zirconium, characterized in that the sum of the diffraction intensities Itotal >= (I28.3 + I30.3 + I31.5) of the metal oxide is 2000 cps (counts per second) or more as measured by subjecting the metal oxide to powder X-ray diffraction analysis, where I28.3 represents the monoclinic (-111) lattice plane diffraction intensity of zirconia at a diffraction angle 2θ >= 28.3º, I30.3 represents the diffraction intensity of the tetragonal lattice plane (111) of zirconia at a diffraction angle 2θ >= 30.3º, and I31.5 represents the diffraction intensity of the (111) monoclinic lattice plane of zirconia at a diffraction angle 2θ >= 31.5º, in which the Itotal value is obtained with the following procedure and measurement conditions: (i) measurement conditions : measuring apparatus: "Rigaku RINT 2500VC X-ray diffractometer" available from Rigaku Corp., X-ray source : Cu/Kα radiation, tube voltage: 40 kV; tube current: 120 mA, measurement range: 2θ >= 10 to 80º, sample to be measured: the sample is prepared by compressing an aggregate having an area of 320 mm2 and a thickness of 1 mm in a hole or slot of filling with sample of the sampling plate according to the following sample preparation procedure, X-ray scanning speed: 10º/min, (ii) procedure: the sample to be measured is completely pulverized and reduced to powder for give 10 μm diameter 60 using an agate mortar, the sampling plate is placed on a flat glass plate having a size of 10 cm square and a thickness of 5 mm, and the sample is evenly and homogeneously introduced into a sample-filling hole or slot of the sampling plate such that the surface of the sample is brought into flush alignment with the surface of the sampling plate.
priorityDate 2009-02-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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