http://rdf.ncbi.nlm.nih.gov/pubchem/patent/ES-2502442-T3

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filingDate 2011-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_25f5e7a185c0f936d31268694581fc7d
publicationDate 2014-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber ES-2502442-T3
titleOfInvention Integrated silicon circuit that includes a physically non-reproducible function, procedure and test system of said circuit
abstract Silicon integrated circuit that includes a physically non-reproducible LPUF function that allows the generation of a signature specific to said circuit, said function being characterized in that it includes: - a ring oscillator composed of a loop (502) traversed by a signal e, being said loop formed by N topologically identical delay chains (500, 501), connected in series with each other, and an inversion gate (503), a delay chain (500, 501) being composed of M delay elements (506, 507) connected in series with each other; - a control module (505) that generates N control words (C1, C2), said words being used to configure the value of the delays introduced by the delay chains in the signal e that runs through them; - a measuring module (504) that measures the frequency of the signal at the output of the last delay chain (501) after updating the control words; - means to deduce from the frequency measurements the bits that make up the signature of the circuit.
priorityDate 2010-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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