Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_77976b2202fc913cffd0f186f9b23c40 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L19-147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L19-0681 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L1-2206 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L5-0019 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L1-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M5-00 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L7-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L1-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01G3-12 |
filingDate |
2019-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_780338b82bff305e12ab28d203b1ba9a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2342951f2bb291a531b6d04001d6e81f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_47830f26f307f3c0cae9fa6d8143a4dc |
publicationDate |
2020-12-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-3746756-A1 |
titleOfInvention |
Apparatus for measuring strain and methods for making and using same |
abstract |
The invention relates to a strain gage and methods for making and using the same to measure strain of a surface of interest. In particular, the invention relates to a semiconductor strain gage held by a metal body using a ceramic interface between the gage and the body, which that can be attached to a surface of interest. The invention also relates to methods for making the ceramic interface and attaching the semiconductor strain gage to a surface of interest. The invention, including its various embodiments, also relates to using the semiconductor strain gage to measure strain at temperatures above 1000°F. |
priorityDate |
2018-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |