http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3674687-A1

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filingDate 2018-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fd6a685eb87af1b8d63e2a718291efb
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publicationDate 2020-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-3674687-A1
titleOfInvention Method and apparatus for monitoring dry state of electrode substrate
abstract The present invention relates to an apparatus and method for monitoring a dry state of an electrode substrate in which electrode slurry is applied to a collector. The monitoring method according to the present invention comprises a step of emitting light onto a surface of the electrode substrate; a step of receiving the light reflected by the surface of the electrode substrate; and a step of analyzing a luminous intensity or spectrum of the received light to estimate a drying rate of the electrode substrate. n The apparatus for monitoring a dry state of an electrode substrate in which electrode slurry is applied to a collector according to the present invention: a light emitting part emitting light from a light source onto a surface of the electrode substrate; a light receiving part receiving the light reflected by the surface of the electrode substrate; and a computing device analyzing a luminous intensity or spectrum of the received light and comparing analyzed characteristics of the light with the reference data of the reflected light to the drying rate of the electrode substrate.
priorityDate 2018-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 35.