Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_33c922e05f6133b7d72dbb849d77487d |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-062 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-8859 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2217 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-8868 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2244 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-2214 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-96 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N31-12 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N31-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-96 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-06 |
filingDate |
2018-07-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_54da1053fe698123e9482e7d757564b7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a7cd0d3cad0e848c1cf9564f0d5f6a4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5f0aad577f19823ab8dc604139bca81a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc4e9940a9e6d9824183f5fd49eb7f4c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3fa8f6926ba0912b205cb931ff3b3625 |
publicationDate |
2020-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-3671206-A1 |
titleOfInvention |
Method for quantitatively analyzing residual cl in zinc ferrite |
abstract |
The present invention relates to a method for quantitative analysis of residual Cl in zinc ferrite synthesized from chloride precursors such as zinc chloride, iron chloride and the like, and provides a method for applying an ion chromatography (IC) device equipped with an automatic quick furnace (AQF) used for quantitative analyses of organic samples only to quantitative analysis of residual Cl in the synthesized inorganic materials, by burning zinc ferrite in Sn capsules with tungsten oxide (WO 3 ) in the AQF and then quantifying gaseous Cl released by combustion of the zinc ferrite by using the IC. |
priorityDate |
2017-08-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |