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filingDate 2019-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4fc0025682c8adb27c90d36fb33f1e1a
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publicationDate 2020-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-3627541-A1
titleOfInvention Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions
abstract Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions, and methods of fabricating neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions, are described. For example, a structure includes first and second vertical arrangements of nanowires, the nanowires of the second vertical arrangement of nanowires (404) having a horizontal width greater than a horizontal width of the nanowires (406) of the first vertical arrangement of nanowires. First and second gate stacks are over the first and second vertical arrangements of nanowires, respectively. First epitaxial source or drain structures (412') are at ends of the first vertical arrangement of nanowires, and second epitaxial source or drain structures (410') are at ends of the second vertical arrangement of nanowires. An intervening dielectric structure (432) is between neighboring ones of the first epitaxial source or drain structures (412') and of the second epitaxial source or drain structures (410').
priorityDate 2018-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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