http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3495828-A1

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filingDate 2017-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db1c50f0cede7226939178d7329f26e5
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publicationDate 2019-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-3495828-A1
titleOfInvention Probe card and inspection method
abstract A probe card (100) according to the present invention inspects a workpiece (50) including a plurality of pads (51). The probe card (100) includes: a secondary battery (10) of a planar shape including a planar electrode (22) of a planar shape and disposed such that the planar electrode (22) faces the workpiece (50); and an electrical connection body (30) disposed between the workpiece (50) and the secondary battery (10). The secondary battery (10) includes a structure that a wiring can be drawn from an optional portion of the planar electrode (22). The electrical connection body (30) includes a plurality of contacts (31) protruding toward the facing pads (51), and electrically connects a plurality of pads (51) and the planar electrode (22) with a plurality of contacts (31) interposed therebetween.
priorityDate 2016-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.