| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c8ed020d9d1eed3acfa2285b2f55de30 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2218-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2218-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-2433
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-725
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7275
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V30-242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-24155
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16H50-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N7-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F17-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-00 |
| filingDate |
2017-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_639be8f2eec6efe9fd1d0762784d3b21
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d3cd4d151c315fb82699fe7922c4b400
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_638fdfe7863783ae713fe3a4fd999acc |
| publicationDate |
2019-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-3494486-A1 |
| titleOfInvention |
System monitor and method of system monitoring |
| abstract |
System monitors and methods of monitoring a system are disclosed. In one arrangement a system monitor predicts a future state of a system. A data receiving unit receives system data representing a set of one or more measurements performed on the system. A first statistical model is fitted to the system data. The first statistical model is compared to each of a plurality of dictionary entries in a database. Each dictionary entry comprises a second statistical model. The second statistical model is of the same general class as the first statistical model and obtained by fitting the second statistical model to data representing a set of one or more previous measurements performed on a system of the same type as the system being monitored and having a known subsequent state. A prediction of a future state of the system being monitored is output based on the comparison. The first statistical model and the second statistical model are each a stochastic process or approximation to a stochastic process. |
| priorityDate |
2016-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |