Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c7fecfd3f98941c70d51d9cf0067758a |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-1734 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3586 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-655 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-636 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-0675 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6417 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-1455 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-14532 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-65 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0075 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3581 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-21 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-0229 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-0224 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-2803 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-021 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-59 |
filingDate |
2017-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f813740f9a7da28f75d72e6f4424f4e7 |
publicationDate |
2018-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-3403067-A1 |
titleOfInvention |
System and method for multi-parameter spectroscopy |
abstract |
An apparatus for detecting a material within a sample includes a light emitting unit for directing at least one light beam through the sample. A plurality of units receive the light beam that has passed through the sample and performs a spectroscopic analysis of the sample based on the received light beam. Each of the plurality of units analyze a different parameter with respect to the sample a provide a separate output signal with respect to the analysis. A processor detects the material with respect each of the provided separate output signals. |
priorityDate |
2016-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |