http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3334050-A1

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filingDate 2016-12-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2018-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-3334050-A1
titleOfInvention A method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
abstract A method of offset calibration in a SAR ADC (200) comprising the steps of: determining a number of bits of an analog input signal (V IN ); detecting if a binary code determined from the analog input signal (V IN ) matches at least one trigger code; using at least one setting code to determine a calibration bit (B * LSB ; B* MSB ); analyzing a bit of the digital signal (C OUT ) and the calibration bit (B * LSB ; B* MSB ); determining an indication of a presence of offset error; and calibrating the offset error. As the determination of the calibration bit (B * LSB ; B * MSB ) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
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