| abstract |
A nanoparticle screening chip and a method using said chip allowing for determining physical properties of nanoparticles, wherein the screening chip comprises a substrate having a working surface divided into a plurality of areas, wherein (1) each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy γ TOT of the surface of each area being defined as follows: γ TOT = γ LW + 2(γ+γ - ) 0.5 , wherein the components are: γ LW =dispersive component = d, γ + = electron acceptor component = b, γ-= electron donor component = a; and (2) each of these areas comprises a plurality of subareas, each subarea comprising an array of sub-micrometric holes or elongated grooves with a different aperture size (S1, S2, S3,...). |