http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3185010-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_16b9a136fb6a114d1b63319f63364941 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_49308e8718b2bc5be941bc5b7a1d2443 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0032 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-00 |
| filingDate | 2016-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dfc750fadef9fe1b101bd0e8dd25c718 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_198d76aad9b99ec74fd3ee621608dac9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f019d7ef494a13d11e3cb2b735daa70c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32386a72355afee74d5a4e2cc9307c46 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59db99186cda220867cca9d1414de053 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6c7483c2a216d767f4e76b87ce4a174 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_22c02d420e4fafa5505d0421706a11c2 |
| publicationDate | 2017-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-3185010-A1 |
| titleOfInvention | Hydrogen concentration measuring device |
| abstract | The present invention provides a hydrogen concentration measuring device capable of measuring with high accuracy a hydrogen concentration over an extensive range by a simple configuration. A hydrogen concentration measuring device 1 includes: a sensor chip 2 which detects the electric resistance of a sensing film 2a; an optical measurement unit 3 which detects the transmitted light intensity of the sensing film 2a; and a controller which performs first hydrogen concentration measurement processing whereby to measure a hydrogen concentration in the gas atmosphere on the basis of a detected electric resistance in a first measurement range, second hydrogen concentration measurement processing whereby to measure a hydrogen concentration in a gas atmosphere on the basis of the detected transmitted light intensity in a second measurement range having at least a part thereof overlapping with the first measurement range, and measurement value correction processing in which a difference between the hydrogen concentration measured by the first hydrogen concentration measurement processing and the hydrogen concentration measured by the second hydrogen concentration measurement processing is reduced to determine the measurement value of the hydrogen concentration in a range in which the first measurement range and the second measurement range overlap. |
| priorityDate | 2015-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 34.