http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3154432-A2

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publicationDate 2017-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-3154432-A2
titleOfInvention System and method for determining x-ray exposure parameters
abstract In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system.
priorityDate 2014-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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