| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cf7550d6ed833569cf80c3a48859e3ba |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F2203-13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8917 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3586
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-453
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8914
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-0208 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-89
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-02 |
| filingDate |
2014-02-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5a1f506d32990803af14d8dd60e42ce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_434bd4cc711cd9a4ced454293ee4ccf0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6f1b4b6029b83b855e39880c84f243b |
| publicationDate |
2015-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-2913665-A1 |
| titleOfInvention |
Method, optics, measuring device and measuring system for spatially resolved terahertz time range spectroscopy |
| abstract |
The invention relates to a method with which terahertz pulses locally and temporally separated terahertz subpulses are generated with a unique time-place relationship, which open the possibility of spatially resolved measurements by means of THz time domain spectroscopy, further comprising a measuring device for implementing this method, comprising THz time domain spectrometer with an optical system according to the invention for generating such THz subpulses, a modular measuring system with at least one such measuring device and a use of the method, the measuring device and the measuring system for error detection and localization, in particular for non-destructive inline quality control in the continuous industrial Production of continuous band-shaped products, eg. As paper and plastic sheets, with electromagnetic radiation in the THz range. |
| priorityDate |
2014-02-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |