Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a188d15e53f61fc61b985decfe6ec8cc |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-052 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-134 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-366 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-1395 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-1601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-0404 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-1651 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-1639 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-0492 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C18-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M4-386 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81C1-00539 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C18-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C18-16 |
filingDate |
2012-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_629c74f3e578c1b503ac2ea30148c6a2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e168de23c9780605f774461ee907f49 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a120b843ea2a6913dc2d6222ef57e376 |
publicationDate |
2014-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-2794954-A2 |
titleOfInvention |
Etched silicon structures, method of forming etched silicon structures and uses thereof |
abstract |
A method of etching silicon, the method comprising the steps of: electrolessly depositing a first metal onto a silicon surface to be etched, wherein the electrolessly deposited first metal partially covers the surface of the silicon to be etched; depositing a second metal that is different from the first metal over the silicon surface and the electrolessly deposited first metal, wherein a film of the deposited second metal covers the silicon surface to be etched; removing the first metal and the second metal from regions of the film of the deposited second metal that overlie the first metal to leave the second metal partially covering the silicon surface to be etched; and etching the silicon by exposing the silicon surface to an aqueous etching composition comprising an oxidant and a source of fluoride ions. |
priorityDate |
2011-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |