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filingDate 2012-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32456b4808c3830952c74e0b95189c33
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publicationDate 2014-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-2728967-A1
titleOfInvention Organic light-emitting diode manufacturing method, organic light-emitting diode, image display device, illumination device, and substrate
abstract A method of manufacturing an organic light-emitting diode of a first aspect includes: a step of preparing, by a dry etching method using a particle single layer film as an etching mask, a substrate provided with an uneven structure in which a plurality of unevenness is arranged in two dimensions on the surface of the substrate, and a step of stacking, on the uneven structure, at least an anode conductive layer, an EL layer including a light-emitting layer containing an organic light-emitting material, and a cathode conductive layer containing a metal layer, such that the uneven structure is reproduced on the surface of the metal layer on the side of the EL layer, wherein the particle mono layer film is formed using a mixture of a plurality of particles having different particle sizes, and an uneven structure is provided which satisfies a requirement (A) that the average height is at least 15 nm but not more than 150 nm, and a requirement (B) that the spectral intensity of the height distribution has a finite value across the entire range in which the absolute value |k| of a wave number is denoted by formula (I) shown below, and the integral value of the spectral intensity across the range accounts for 35% or more of the integral value of the spectral intensity across the entire wave number range. n[Mathematical Formula 1] Re ⁢ 2 ⁢ π λ max ⋅ ε m λ max ⋅ ε d λ max ε m λ max + ε d λ max ≤ k ≤ Re ⁢ 2 ⁢ π λ min ⋅ ε m λ min ⋅ ε d λ min ε m λ min + ε d λ min nε m (λ) represents the relative dielectric constant of the metal that constitutes the metal layer. nε d (λ) represents the equivalent relative dielectric constant of the EL layer. nλ max represents the maximum extracted wavelength, and λ min represents the minimum extracted wavelength. nRe[ ] denotes the real part of a complex number.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3307024-A4
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priorityDate 2011-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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