| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_33b011e77b33662b8bf1f2ff2de7b661 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0056
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0064
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02091
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-4795 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B27-58 |
| filingDate |
2007-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1e74b536f5f4157293a2c9ad2dded9d0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9ffec963b48b5298dc02c07a503c95ce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d1b1b7d1c350eb26c6e34e2e45c8c73a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c2e531fc953ea4f7956d6ed0b7e4af19 |
| publicationDate |
2009-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-2078222-A2 |
| titleOfInvention |
Interferometric synthetic aperture microscopy |
| abstract |
Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of substantially collimated light characterized by a temporally dependent spectrum. The beam is focused in a plane characterized by a fixed displacement along the propagation axis of the beam, and scattered light from the sample is superposed with a reference beam derived from the substantially collimated source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measured data to structure of an object to allow solution of an inverse scattering problem based upon the interference signal so that a three-dimensional structure of the sample may be inferred in near real time. |
| priorityDate |
2006-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |