http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1928021-A1

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filingDate 2007-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6527cd92bf662b4d04616689b44bd8a
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publicationDate 2008-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1928021-A1
titleOfInvention Method of manufacturing a semiconductor device with dual fully silicided gate
abstract Manufacturing a dual work function semiconductor device involves providing a first metal layer (108) over a first electrode (102a) in a first region (101a), and at least a first work function tuning element. Also provided is a second metal layer (109) of a second metal in a second region (101b) at least over a second electrode (102b). A first silicidation of the first electrode (102a) and a second silicidation of the second electrode (102b) are performed simultaneously.
priorityDate 2006-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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