| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d2fdeffea193ed09983279e6b05205b2 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-547 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67057
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67253
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-1804
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67086 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-04 |
| filingDate |
2007-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5f070730e052c0951a041371ce958e2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a45ddd831aeec2707d95039372b93005
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b5597ae2b354e0d69f49a08d4e0dedf2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8668ac3bd301f8cd32749521ce55a96a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7a2421802db987c1db5116ca51063b1c |
| publicationDate |
2008-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1912076-A2 |
| titleOfInvention |
Method and device for characterising wafers during manufacture of solar cells |
| abstract |
The invention relates to a method for characterizing wafers in the production of solar cells, comprising the steps: a) providing a wafer and performing a manufacturing process with the wafer for producing a solar cell or multiple solar cells; b) during the manufacturing process, performing a wet chemistry step with the wafer, wherein the wet chemistry step reduces an influence of the wafer surface on the lifetime of charge carriers in the wafer; c) during the wet chemistry step or after the wet chemical step, irradiating the wafer with light to create charge carriers in the wafer; d) determining the lifetime of the charge carriers generated in step c); and e) characterizing the wafer based on the lifetime determined in step d).n n n In a second aspect, the invention relates to an apparatus for characterizing wafers in the manufacture of solar cells. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108231614-A |
| priorityDate |
2006-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |