http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1788581-A2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_827f58bacb8fef905977e1f8b3c7aace |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K7-015 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K3-005 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K7-01 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C17-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C16-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C16-22 |
| filingDate | 2006-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0de997e55468f0729b6fc7b6a1104352 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4c96dd18e82d920f4758f0d9a8410eab |
| publicationDate | 2007-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-1788581-A2 |
| titleOfInvention | Temperature tamper detection circuit and method |
| abstract | An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105425890-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8092400-B2 |
| priorityDate | 2005-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 23.