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filingDate 2005-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_78ea0951a50c518406bf4bef4bd6e4b8
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publicationDate 2007-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1744167-A1
titleOfInvention Sheet-like probe, method of producing the probe, and application of the probe
abstract [Problem] n It is an object to provide a sheet-like probe in which a stable connecting state can also be achieved for a circuit device having minute electrodes at a fine pitch, an electrode structure can be prevented from slipping from an insulating film so that a high durability can be obtained, a positional shift of the electrode structure from an electrode to be inspected can be reliably prevented from being caused by a change in a temperature in a burn-in test for a circuit device in which a wafer has a large area and the electrode to be inspected has a small pitch, and an excellent connecting state can be maintained stably, and a method of manufacturing the same. n [Means for Solving Problems] n A sheet-like probe according to the present invention comprises: nan insulating layer; and na contact film including a plurality of electrode structures disposed on the insulating layer apart from each other in a planar direction thereof and extended to penetrate in a direction of a thickness of the insulating layer, neach of the electrode structures including: na surface electrode portion exposed from a surface of the insulating layer, projected from the surface of the insulating layer, and shaped to have a diameter which is gradually reduced from the base end toward a tip; na back electrode portion exposed from a back face of the insulating layer; and na short circuit portion extended to penetrate through the insulating layer in a direction of a thickness thereof continuously from a base end of the surface electrode portion and coupled to the back electrode portion, n nwherein a diameter of the base end of the surface electrode portion is larger than a diameter of the end of the side which comes into contact with the surface electrode portion on the short circuit portion, and na thickness of the short circuit portion is larger than a thickness of the insulating layer.
priorityDate 2004-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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