http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1723405-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a06ecfa324bbac8a1dc4fd17d94fd21e |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-0205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-042 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-02 |
| filingDate | 2005-03-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5e2167d3c0df4817d4821753302e6c5f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e7ac50db5d1fb275c27fde7fb59f24d8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2d1038a702c5528478dc0c302cdef461 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a5ddecf8e8707c96b36dac538d23433c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_05aa44e18c7d2d07834f919c9d876b9e |
| publicationDate | 2006-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-1723405-A1 |
| titleOfInvention | Method and device for characterising multiple samples of one or several dispersions |
| abstract | The invention relates to a method and device for automatically determine physical and colloidal characteristics selected (for example according to the grain size, distribution of the grain sizes, a hindrance function and a structural stability indexes) by detecting the attenuation of waves injected through mono or polydispersed samples exposed to gravitation or centrifugation. Said invention is characterised in that during separation by gravitation or centrifugation at any moment, simultaneously for several samples which are also concentrated and exhibit known and/or unknown physical or colloidal characteristics, the instantaneous characterising an actual separation state transmission IT(t, r) of the waves injected at intensity I0(t, r) and/or instantaneous diffusion IS(t, r) are detected at a high resolution and repeatedly recorded as a function of the position thereof inside a sample for one or several wavelengths on the entire sample length or the selected segment thereof. |
| priorityDate | 2004-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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