| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_430c89d97f6839f5364904e710af9704 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-144444
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-115831
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-112499
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-11 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-3273
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-416 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-416 |
| filingDate |
2004-10-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_51366b3fe0f12fb54fa34e494734b214 |
| publicationDate |
2006-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1679510-A1 |
| titleOfInvention |
Specimen analysis method and specimen analysis device |
| abstract |
The present invention relates to a technique for analyzing a sample by utilizing a double integration circuit (11) for outputting a physical quantity related to the output from an analytical tool (2). In the present invention, the time interval from when the output from the analytical tool (2) is inputted into the double integration circuit (11) till when the physical quantity is started to be outputted from the double integration circuit (11) differs before and after the supply of the sample to the analytical tool (2) is confirmed. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016016255-A1 |
| priorityDate |
2003-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |