| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b97b926f58043c3264d0fd9d4c0387b6 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-54373 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N-
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-543
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F19-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-48 |
| filingDate |
2003-11-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_42ae82568efb171e722ae909d25bace1 |
| publicationDate |
2005-10-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1581808-A2 |
| titleOfInvention |
Method and system for analyzing test devices |
| abstract |
A method and system (10) for automatically and optically analyzing one or more test devices using a digital scanner (14) coupled to a computer (12). |
| priorityDate |
2002-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |